荧光分光光度计

日立F4500荧光分光光度计,简要操作流程

Instrument栏

Corrected spectra

a function for determining the spectrum inherent to a sample by correcting the photometer wavelength characteristic using the saved instrument parameters, following measurement with the instrument parameters for photometer control. if there are no instrument parameters for the wavelength range to be measured, only the wavelength range that allows correction is scanned. and if there is no wavelength area measurable, an error will occur. the instrument response command is provided in the utility menu for operating this function. when this setting is at ON, "corrected spectra" appears on the monitor window.

为确定频谱固有纠正光度计使用已保存的仪器参数波长的特点,以一个示例函数,以下为光度计控制仪器参数的测量。如果有对波长范围内没有工具来衡量的参数,只有波长范围,允许更正扫描。如果没有可测量的波长范围,将出现错误。仪器响应命令中提供了这一功能实用操作菜单。当此设置为ON时,“纠正谱”出现在监视器窗口。

Shutter control

the shutter can automatically be closed in other than measurement for slowing down sample deterioration due to the energy of excitation beam and opened when measurement starts. when you put a check mark at the head, the shutter will close, and open at start of measurement. the shutter will close again when measuring wavelength begins returning to the start wavelength after measurement in the wavelength scan mode.

光栅可自动关闭,除用于减缓恶化,由于样品的激发光束的能量测量,测量时打开启动。当你把在头一个选中标记,快门将关闭,并在测量开始开放。快门将关闭测量波长时再开始返回后,开始波长的波长扫描方式测量。

Monitor栏

Open data processing window after data acquisition

select whether or not to conduct data processing after sample measurement . when select( check mark is applied), an icon is displayed for the data processing window at the end of measurement. and by opening this icon, data processing such as peak detection is available.

选择是否进行数据处理后样品的测量。当选择(检查商标的),显示一个图标为在测量数据处理窗口结束。并开放该图标,数据处理,如峰值检测可用。

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